Equipment Model

Rigaku Ultima IV

Description

The X-Ray Diffractometer (XRD) is an advanced analytical instrument used to determine the crystallographic structure, phase composition, and physical properties of materials. The Rigaku Ultima IV offers high-precision diffraction analysis, making it ideal for research and industrial applications.

Lab

DST-FIST Sponsored Lab

Institute

Manipal Institute of Applied Physics (MIAP)

Location

Ground Floor, AB-5, Manipal Institute of Applied Physics, Eshwar Nagar, Manipal, Udupi, Karnataka 576104, India

• Applications

  • Material science for crystalline structure determination.

  • Pharmaceutical industry for polymorph identification in drugs.

  • Nanotechnology for nanoparticle and thin film analysis.

  • Geology and mining for mineral phase identification.

  • Semiconductor industry for thin-film characterization.

• Key Features

  • High-resolution X-ray optics for detailed diffraction patterns.

  • Versatile scanning modes for powders and thin films.

  • User-friendly software for phase identification and analysis.

  • Automated sample handling for efficient measurements.

  • Advanced detectors for rapid data acquisition.